Data Collection Wizard
The Data Collection Wizard provides a unified interface for setting up all aspects of a measurement. Instead of configuring image, x-ray, segmentation, and classification settings through separate dialogs, the wizard combines everything into a single tabbed view.
{{FIG: Data Collection Wizard showing the main window with tab strip, navigation buttons, and image preview area | IDD_WIZARD_MAIN}}
Accessing the Wizard
Open the Data Collection Wizard from the Investigator ribbon:
- Select a specimen in the Investigator tree
- Click Add Measurement or double-click an existing measurement to edit its settings
- The wizard opens with all tabs available
Wizard Layout
The wizard has three areas:
- Top bar — Navigation controls: Experiment / Hole / Object radio buttons, Automation Mode dropdown, Select Parent dropdown, and New button
- Center — Measurement list (left) and image preview (right)
- Bottom — Six configuration tabs
Image Tab
Configure BSE image acquisition settings.
{{FIG: Data Collection Wizard Image tab showing Image Control, Measure Sequence, Stop, and Background Filter groups | Wizard Image tab}}
Image Control
Setting | Description |
|---|---|
Keep Primary Image | Retain the BSE image in the measurement file |
2nd Channel Image | Also collect a second detector channel (SE, CL, etc.) |
Monitor Image Stability | Check BSE stability at a configurable time interval |
Reduce Noise | Apply noise reduction to collected images |
Finish the Line | Complete the current scan line before stopping |
Image Properties
Button | Description |
|---|---|
Quality | Set the scan speed / dwell time (Low, Medium Low, Medium, Medium High, High) |
Resolution | Set the image resolution in pixels |
Size | Set the field of view size |
Overlap | Slider to set the field overlap percentage (0–50%) |
Particle Size
Setting | Description |
|---|---|
Minimum Particle Size (um) | Minimum particle size to detect |
Maximum Particle Size (um) | Maximum particle size to detect |
Measurement Coverage
Option | Description |
|---|---|
Entire Area | Measure the full defined area |
Inside Fields | Only measure within defined field boundaries |
Measure Sequence
Controls the order in which fields are scanned:
Option | Description |
|---|---|
From Center | Start scanning from the center of the measurement area (default) |
Top → Down | Scan from top to bottom, left to right |
Bottom → Up | Scan from bottom to top |
Random | Scan fields in random order |
Stop Conditions
Define when the measurement should end. Enable multiple conditions and combine them with Or or And logic:
Condition | Description |
|---|---|
Cover Whole Area | Stop when all fields in the measurement area have been scanned |
Frames | Stop after a specified number of fields |
Time | Stop after a specified number of minutes |
Particles | Stop after a specified number of particles are identified |
See [Custom Termination Conditions] for details on combining conditions.
Background Filter Parameters
Setting | Description |
|---|---|
Upper | Upper grey level threshold for background detection |
Lower | Lower grey level threshold for background detection |
Extract Background | Yes/No — whether to extract and classify background pixels |
X-Ray Tab
Configure EDS x-ray acquisition and segmentation settings.
{{FIG: Data Collection Wizard X-Ray tab showing Excitation, Segmentation Mode, and segmentation image preview | Wizard X-Ray tab}}
Excitation
Setting | Description |
|---|---|
Voltage (kV) | Accelerating voltage for x-ray excitation |
Current (CPS) | Detector count rate |
Dwell Time | Acquire x-rays for a fixed time (milliseconds) |
Counts | Acquire until a target count is reached |
Enter Current | Manually enter probe current (nA) |
Record Current / Set Current | Record or set current using a reference standard |
Source | X-ray source selection |
Segmentation Mode
Select the measurement mode:
Mode | Description |
|---|---|
Segmentation | Standard segmentation — BSE image is segmented, x-rays collected per segment |
Matrix | Matrix mapping — x-rays collected on a regular grid |
Search and Segment | Rare phase search — scan for bright phases, then segment and collect x-rays |
Hypermap | Full hyperspectral mapping — x-ray spectrum at every pixel |
Hybrid (triggers) | Triggered collection — x-rays collected only when trigger conditions are met |
Search + Hypermap | Combine rare phase search with hypermap collection |
Grid Mapping Modes
For Matrix and grid-based modes:
Setting | Description |
|---|---|
Line Mode | Collect x-rays along lines rather than a grid |
X Spacing (um) | Horizontal spacing between x-ray points |
Y Spacing (um) | Vertical spacing (line mode only) |
Segmentation Preview
The right side of the tab shows a live segmentation preview of the current BSE image with the active segmentation parameters applied:
Control | Description |
|---|---|
Grey Level Factor | Slider controlling BSE grey level sensitivity for segment boundaries |
Area Factor | Slider controlling minimum segment area |
Minimum Size (um) | Minimum segment size |
Segments as Outlines | Show segment boundaries as outlines on the preview image |
X-Ray Collection
Setting | Description |
|---|---|
Plot X-Ray | Display x-ray points on the image during collection |
Search Tab
Configure scan filter settings for rare phase search and hardware-adjusted collection modes.
{{FIG: Data Collection Wizard Search tab showing scan filter options and hardware settings | Wizard Search tab}}
Scan Filter Selection
Option | Description |
|---|---|
No Scan Filter | No pre-filtering — collect on all segments |
Image Scan Filter | Pre-scan with different image settings before detailed collection |
Elemental Scan Filter | Pre-scan with x-ray analysis to select regions of interest |
Image Scan Filter
When Image Scan Filter is selected:
Setting | Description |
|---|---|
Quality | Scan speed for the pre-scan |
Resolution | Enable resolution override |
Scan Speed | Specific scan speed setting |
Image Width | Image width for the pre-scan |
Elemental Scan Filter
Setting | Description |
|---|---|
Xray Time | Collection time for the pre-scan x-ray analysis |
Scan by Different Hardware Settings
For drive-back and AOI (Area of Interest) modes:
Setting | Description |
|---|---|
AOI Buffer (um) | Buffer zone around areas of interest |
Max AOI/Field | Maximum number of AOIs per field |
Max Total AOI | Maximum total AOIs across the measurement |
Scan Field Width (um) | Field width for the drive-back scan |
Working Distance | Working distance for drive-back |
Stage Height | Stage height for drive-back |
Focus / Magnification | Optical parameters for drive-back |
Adjust Stage Height | Automatically adjust stage height for drive-back |
Read / Set | Read current hardware values or set them |
Drive-back Tab
Configure drive-back collection for targeted analysis of specific particles or regions.
{{FIG: Data Collection Wizard Drive-back tab showing target type, spectra display, and collection options | Wizard Drive-back tab}}
Targets
Setting | Description |
|---|---|
Centroid Point | Drive back to the centroid of each target particle |
Multi-collect | Collect multiple x-ray points per target |
Hypermap | Collect a full hypermap for each target |
Filter | Apply a filter to select which particles to target |
Edit | Edit the filter parameters |
From Experiment | Use targets from an existing experiment |
Collect Image | Capture an image at each drive-back location |
Max # | Maximum number of targets to visit |
Collection Options
Setting | Description |
|---|---|
Collect X-Ray | Collect x-ray spectra at each target |
Quantification | Perform quantification at each target |
Quantification method | Select the quantification method to apply |
The center area displays a spectrum preview and elemental data for the selected target.
Triggers Tab
Configure segment triggers for hybrid measurement modes.
{{FIG: Data Collection Wizard Triggers tab showing embedded trigger configuration dialog | Wizard Triggers tab}}
The Triggers tab embeds the full segment trigger configuration interface. See [Segmentation Triggers] for detailed documentation of trigger types and parameters.
Properties Tab
Set measurement naming, classification workflow, and template settings.
{{FIG: Data Collection Wizard Properties tab showing Name, Classification Workflow, and Template sections | Wizard Properties tab}}
Name
Setting | Description |
|---|---|
Experiment | Name for the experiment |
Specimen | Name for the specimen |
Classification Workflow Upon Completion
Option | Description |
|---|---|
Do Not Classify | Do not run classification after measurement |
Classify During Experiment | Run classification in real-time as data is collected |
Classify After Completion | Run classification after the measurement finishes |
Add to Project | Select which project to add the measurement to |
Classification Workflow | Select which workflow to apply |
Template Measurement
Setting | Description |
|---|---|
Measurement List | Select a saved measurement to use as a template |
Apply | Apply the selected template's settings to the current measurement |
Additional Options
Setting | Description |
|---|---|
Stitch Image Mosaic | Automatically stitch fields into a mosaic after measurement |
The right side shows a properties panel with additional measurement metadata.
Workflow
A typical workflow using the Data Collection Wizard:
- Select or create a specimen in the Investigator tree
- Open the wizard
- Image tab — Set image quality, resolution, overlap, and stop conditions
- X-Ray tab — Choose segmentation mode, set excitation parameters and segmentation thresholds
- Search tab — (Optional) Configure scan filters if using rare phase search or hybrid modes
- Drive-back tab — (Optional) Set up targeted analysis for specific particles
- Triggers tab — (Optional) Define triggers for hybrid measurement modes
- Properties tab — Name the experiment, select classification workflow, and optionally apply a template
- Start the measurement
See Also
- [Add a Measurement] — Creating measurements without the wizard
- [Custom Termination Conditions] — Combining stop conditions
- [Segmentation Triggers] — Trigger configuration details
- [Mapping Modes] — Detailed documentation for each segmentation mode
- [Image and EDS Standards] — Setting up BSE and EDS calibration standards