Investigator
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Mapping Modes
Matrix Mapping
6 min
method background matrix mapping mode is similar to the analysis mode used by the legacy qemscan automated mineralogy system, using a fixed grid pattern for the acquisition of x ray data this mapping mode can account for any background, such as the resin mounting material, based on a difference in the bse grey scale level between the specimen material and background material the advantage of the matrix mapping mode is that it ignores any texture in the specimen material, and so is best used for material containing fine structures which are below the image resolution for the sem measurement set up to set up a matrix mapping analysis, this option should be selected during the addition of a new specimen menu from the investigator, or adding this measurement to an existing specimen in the case of adding to a new specimen, the specimen type as well as the classification method should also be selected while for existing samples these options can be changed in the measurement properties panel, but only if there is no existing data stored in the specimen to set up a matrix mapping analysis, this option should be selected during the addition of a new specimen menu from the investigator, or adding this measurement to an existing specimen in the case of adding to a new specimen, the specimen type as well as the classification method should also be selected while for existing samples these options can be changed in the measurement properties panel, but only if there is no existing data stored in the specimen the first section, general properties, for setting up a matrix mapping analysis is the same as other measurement modes, with the ability to add or edit the measurement metadata as well as setting the termination conditions as matrix mapping mode uses the bse image the imaging setting needs to be adjusted the first option, sequence, will set the direction of the fields that will be analyzed, while the quality setting is similar to the sem scan speed and will affect the noise level of the resultant bse image the next two settings, size, will change the number of pixels per field which affects the micro resolution of the image, and the intersect (percentage), will adjust the percentage of overlap between adjacent fields the next three settings, within the image processing section, are important for matrix mapping as this will determine the background window, which will prevent unnecessary analysis of background material to set the bse window, adjust the bg grey level low, which sets the lower threshold, and the bg grey level high, which sets the upper threshold in addition to the bse window settings, there is also a sub menu available via the “extra settings” button this will provide access to “reduce image noise”, which is an image process that will “blur” out edges mainly used to minimize over segmentation due to sample defects there is also access to the option to “collect both channel images” which will instruct amics to record data from a secondary video input (if set up in esprit) the next “xray” section will then define how amics will acquire the x ray data the first setting, space (um), will define the interval between x ray points to be collected, and will then become the cell size used to display the final material map the following radio switch, collect by count, will toggle between using a fixed dwell time, which is set in the “x ray ac time (ms)” setting, and fixed total counts per point using different dwell times, which is set in the “target count” setting which will replace the “x ray ac time (ms)” setting the following three settings, reliability factor, as used for the preliminary matching during data acquisition, more information on these settings can be found https //app archbee com/docs/ulnx6skegc8ehmpkog5xe/b7zegccwrngyos0gffoxp the final option is to allow amics to collect new reference spectra during data acquisition, with more information provided https //app archbee com/docs/ulnx6skegc8ehmpkog5xe/bybc telxnuovl3zwavcn
